Data Governance
catalog · lineage · qualitySchema registry pulled live from BigQuery INFORMATION_SCHEMA, medallion lineage diagram, and per-table quality scorecard (completeness from NULL scans + freshness from MAX(timestamp)).
Schema registry pulled live from BigQuery INFORMATION_SCHEMA, medallion lineage diagram, and per-table quality scorecard (completeness from NULL scans + freshness from MAX(timestamp)).
raw → ingest → bronze → silver → gold → serving. Production would layer a warehouse catalog on top (Dataform / dbt / Unity Catalog).
Completeness = 1 - NULL_rate per key column. Freshness = MAX(timestamp). Run live against BigQuery (60s cache).
| Table | Rows | Completeness | Freshness |
|---|---|---|---|
| wafers | 12,500 | 100.00%equip 100.0% | 2026-04-13 |
| sensors | 99,990 | 100.00% | 2026-04-17T00:00:00+00:00 |
| defects | 45,204 | 100.00%10,678 distinct wafers | — |
| equipment | 30 | 100.00% | — |
| lots | 500 | 65.40% | — |
Wafer-level yield records, one row per wafer with mfg_date partition and lot_id+equip_id clustering.
| Column | Type | Mode |
|---|---|---|
| wafer_id | STRING | REQUIRED |
| lot_id | STRING | REQUIRED |
| equip_id | STRING | REQUIRED |
| product | STRING | NULLABLE |
| yield_rate | FLOAT | NULLABLE |
| bin_pass_rate | FLOAT | NULLABLE |
| defect_count | INTEGER | NULLABLE |
| process_time_min | FLOAT | NULLABLE |
| mfg_date | DATE | NULLABLE |
Lot-level metadata (product node, start/end timestamps, status).
| Column | Type | Mode |
|---|---|---|
| lot_id | STRING | REQUIRED |
| product | STRING | REQUIRED |
| start_time | TIMESTAMP | NULLABLE |
| end_time | TIMESTAMP | NULLABLE |
| status | STRING | NULLABLE |
| wafer_count | INTEGER | NULLABLE |
Equipment master with utilization, MTBF, MTTR baselines.
| Column | Type | Mode |
|---|---|---|
| equip_id | STRING | REQUIRED |
| equip_type | STRING | REQUIRED |
| location | STRING | NULLABLE |
| utilization | FLOAT | NULLABLE |
| mtbf_hours | FLOAT | NULLABLE |
| mttr_hours | FLOAT | NULLABLE |
| install_date | DATE | NULLABLE |
Defect-level inspection records, clustered by wafer_id for wafer-map queries.
| Column | Type | Mode |
|---|---|---|
| defect_id | STRING | REQUIRED |
| wafer_id | STRING | REQUIRED |
| defect_type | STRING | NULLABLE |
| location_x | FLOAT | NULLABLE |
| location_y | FLOAT | NULLABLE |
| size_um | FLOAT | NULLABLE |
| severity | STRING | NULLABLE |
| detected_at | DATE | NULLABLE |
Time-series sensor readings (temperature, pressure, vibration, flow) with anomaly flag.
| Column | Type | Mode |
|---|---|---|
| timestamp | TIMESTAMP | REQUIRED |
| equip_id | STRING | REQUIRED |
| equip_type | STRING | NULLABLE |
| temperature_c | FLOAT | NULLABLE |
| pressure_bar | FLOAT | NULLABLE |
| vibration_g | FLOAT | NULLABLE |
| flow_sccm | FLOAT | NULLABLE |
| is_anomaly_flag | BOOLEAN | NULLABLE |